JEDEC JESD671C

JEDEC JESD671C

Click here to purchase
JEDEC JESD671C now encompasses administrative quality problems, in addition to the electrical and visual/mechanical quality problems that were addressed in the original release. A standard set of problem categories for each of these three types of component problems is presented for tracking and reporting purposes. A common set of customer and supplier expectations and requirements are set forth to help facilitate the successful problem analysis and corrective action of any type of component quality problem. Formerly known as EIA-671 (November 1996). Became JESD671-A after revision, December 1999.

Product Details

Published:
07/01/2018
Number of Pages:
22
File Size:
1 file , 220 KB

You may also like

JEDEC JEB 5-A (R1984)

JEDEC JEB 5-A (R1984)

METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITSstandard by JEDEC Solid State Technology Association, 01/01/1970

JEDEC JEP114.01

JEDEC JEP114.01

GUIDELINES FOR PARTICLE IMPACT NOISE DETECTION (PIND) TESTING, OPERATOR TRAINING, AND CERTIFICATIONstandard by JEDEC Solid State Technology Association, 10/01/2007

JEDEC JEP128

JEDEC JEP128

GUIDE FOR STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER LEVEL ELECTRICAL TESTINGstandard by JEDEC Solid State Technology Association, 11/01/1996

JEDEC JEP122H

JEDEC JEP122H

Failure Mechanisms and Models for Semiconductor Devicesstandard by JEDEC Solid State Technology Association, 09/01/2016

Back to Top