CIE 183:2008

CIE 183:2008

Click here to purchase
A precise objective definition of low-beam visual cut-off is necessary, since arequirement for correct aiming of these beams is specified within all the existingregulations.

At present, aiming of low-beam headlamps is performed visually in Europe andUSA (since 1997), using the cut-off line in the beam pattern.A good definition of a visual cut-off is required to allow uniformity ininterpretations.

This report provides a survey of studies into low beam visual cut-off that havebeen carried out in Europe and North America. Based on these studies, arecommendation is made for the definition and measurement of the cut-off line of alow-beam headlamp by photometric means.

The publication is written in English, with a short summary in French and German. It consists of 19 pages with 6 figures.

Product Details

Published:
08/01/2008
ISBN(s):
9783901906640
Number of Pages:
19
File Size:
1 file , 200 KB

You may also like

CIE ISO 23539:2023

CIE ISO 23539:2023

Photometry - The CIE system of physical photometrystandard by Commission Internationale de L'Eclairage, 2023

CIE 251:2023

CIE 251:2023

LED Reference Spectrum for Photometer Calibrationstandard by Commission Internationale de L'Eclairage, 01/01/2023

CIE x049-P13

CIE x049-P13

IMPACT OF SAMPLING RATE ON FLICKER METRIC CALCULATIONSConference Proceeding by Commission Internationale de L'Eclairage, 10/01/2022

CIE x049-P08

CIE x049-P08

FIELD MEASUREMENT OF TLM QUANTITIES IN LIGHTING SCENARIOSConference Proceeding by Commission Internationale de L'Eclairage, 10/01/2022

Back to Top