ADDENDUM No. 9 to JESD24 - SHORT CIRCUIT WITHSTAND TIME TEST METHODAmendment by JEDEC Solid State Technology Association, 08/01/1992

SERIAL FLASH DISCOVERABLE PARAMETERS (SFDP)standard by JEDEC Solid State Technology Association, 05/01/2014

Potential Failure Mode and Effects Analysis (FMEA)standard by JEDEC Solid State Technology Association, 08/01/2018

GUIDELINES FOR THE MEASUREMENT OF THERMAL RESISTANCE OF GaAs FETSstandard by JEDEC Solid State Technology Association, 07/01/1988

STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TESTstandard by JEDEC Solid State Technology Association, 03/01/2009

ACCELERATED MOISTURE RESISTANCE - UNBIASED HASTstandard by JEDEC Solid State Technology Association, 03/01/2011

ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)standard by JEDEC Solid State Technology Association, 03/01/2010

Universal Flash Storage (UFS)standard by JEDEC Solid State Technology Association, 09/01/2013

STANDARD METHOD FOR CALCULATING THE ELECTROMIGRATION MODEL PARAMETERS FOR CURRENT DENSITY AND TEMPERATUREstandard by JEDEC Solid State Technology Association, 02/01/1998

REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATIONstandard by JEDEC Solid State Technology Association, 10/01/2006

ISOTHERMAL ELECTROMIGRATION TEST PROCEDUREstandard by JEDEC Solid State Technology Association, 10/01/2007

ADAPTER TEST BOARD RELIABILITY TEST GUIDELINESstandard by JEDEC Solid State Technology Association, 01/01/2018