FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTSstandard by JEDEC Solid State Technology Association, 10/01/2013

NAND Flash Interface Interoperabilitystandard by JEDEC Solid State Technology Association, 10/01/2012

TEMPERATURE, BIAS, AND OPERATING LIFEstandard by JEDEC Solid State Technology Association, 12/01/2016

MEASUREMENT OF TEMPERATURE COEFFICIENT OF VOLTAGE REGULATOR DIODESstandard by JEDEC Solid State Technology Association, 02/01/1982

Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devicesstandard by JEDEC Solid State Technology Association, 10/01/2013

DEFINITION OF THE SSTU32S869 & SSTU32D869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONSstandard by JEDEC Solid State Technology Association, 04/01/2007

PROCESS CHARACTERIZATION GUIDELINEstandard by JEDEC Solid State Technology Association, 07/01/1998

System Level ESD Part II: Implementation of Effective ESD Robust Designsstandard by JEDEC Solid State Technology Association, 09/01/2019

EVALUATION PROCEDURE FOR DETERMINING CAPABILITY TO BOTTOM SIDE BOARD ATTACH BY FULL BODY SOLDER IMMERSION OF SMALL SURFACE MOUNT SOLID STATE DEVICESstandard

ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVEstandard by JEDEC Solid State Technology Association, 12/01/2000

NAND Flash Interface Interoperabilitystandard by JEDEC Solid State Technology Association, 10/01/2012

GUIDELINE FOR OBTAINING AND ACCEPTING MATERIAL FOR USE IN HYBRID / MCM PRODUCTSstandard by JEDEC Solid State Technology Association, 05/01/2002