JEDEC JEP133C

JEDEC JEP133C

GUIDE FOR THE PRODUCTION AND ACQUISITION OF RADIATION-HARDNESS ASSURED MULTICHIP MODULES AND HYBRID MICROCIRCUITSstandard by JEDEC Solid State Technology Association, 01/01/2010

JEDEC JESD22-A117E

JEDEC JESD22-A117E

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TESTstandard by JEDEC Solid State Technology Association, 11/01/2018

JEDEC JEP154

JEDEC JEP154

GUIDELINE FOR CHARACTERIZING SOLDER BUMP ELECTROMIGRATION UNDER CONSTANT CURRENT AND TEMPERATURE STRESSstandard by JEDEC Solid State Technology Association, 01/01/2008

JEDEC JESD22-C101F

JEDEC JESD22-C101F

FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTSstandard by JEDEC Solid State Technology Association, 10/01/2013

JEDEC JEP150.01

JEDEC JEP150.01

STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTSstandard by JEDEC Solid State Technology Association, 06/01/2013

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