THERMAL IMPEDANCE MEASUREMENT FOR INSULATED GATE BIPOLAR TRANSISTORS - (Delta VCE(on) Method)Amendment by JEDEC Solid State Technology Association, 06/01/2004

ADDENDUM No. 2 to JESD35 - TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICSstandard by JEDEC Solid State Technology Association, 02/01/1996

Solid-State Drive (SSD) Endurance Workloadsstandard by JEDEC Solid State Technology Association, 07/01/2012

RADIO FRONT END - BASEBAND DIGITAL PARALLEL (RBDP) INTERFACEstandard by JEDEC Solid State Technology Association, 03/01/2007

HIGH EFFECTIVE THERMAL CONDUCTIVITY TEST BOARD FOR LEADED SURFACE MOUNT PACKAGESstandard by JEDEC Solid State Technology Association, 02/01/1999

PHYSICAL DIMENSIONstandard by JEDEC Solid State Technology Association, 06/01/2003

A Guideline for Defining "Low-Halogen" Solid State Devices (Removal of BFR/CFR/PVC)standard by JEDEC Solid State Technology Association, 11/01/2010

PROCESS CHARACTERIZATION GUIDELINEstandard by JEDEC Solid State Technology Association, 08/01/2018

FLIP CHIP TENSILE PULLstandard by JEDEC Solid State Technology Association, 01/01/2009

DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICESstandard by JEDEC Solid State Technology Association, 02/01/1982

JEDEC Dictionary of Terms for Solid-State Technology, Sixth Editionstandard by JEDEC Solid State Technology Association, 06/01/2013

IC LATCH-UP TESTstandard by JEDEC Solid State Technology Association, 11/01/2011