JEDEC JESD82-2

JEDEC JESD82-2

STANDARD FOR DESCRIPTION OF A 3.3 V, 18-BIT, LVTTL I/O REGISTER FOR PC133 REGISTERED DIMM APPLICATIONSstandard by JEDEC Solid State Technology Association,

JEDEC JESD671B

JEDEC JESD671B

Component Quality Problem Analysis and Corrective Action Requirements (Including Administrative Quality Problems)standard by JEDEC Solid State Technology Association, 06/01/2012

JEDEC JS709C

JEDEC JS709C

Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Productsstandard by JEDEC Solid State Technology Association, 03/01/2018

JEDEC JESD24-12

JEDEC JESD24-12

THERMAL IMPEDANCE MEASUREMENT FOR INSULATED GATE BIPOLAR TRANSISTORS - (Delta VCE(on) Method)Amendment by JEDEC Solid State Technology Association, 06/01/2004

JEDEC JESD 35-2

JEDEC JESD 35-2

ADDENDUM No. 2 to JESD35 - TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICSstandard by JEDEC Solid State Technology Association, 02/01/1996

JEDEC JESD 82-25

JEDEC JESD 82-25

DEFINITION OF the SSTUB32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONSstandard by JEDEC Solid State Technology Association, 05/01/2007

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