JEDEC JESD51

JEDEC JESD51

METHODOLOGY FOR THE THERMAL MEASUREMENT OF COMPONENT PACKAGES (SINGLE SEMICONDUCTOR DEVICE)standard by JEDEC Solid State Technology Association, 12/01/1995

JEDEC JESD82-1A

JEDEC JESD82-1A

DEFINITION OF CVF857 PLL CLOCK DRIVER FOR REGISTERED PC1600, PC2100, PC2700, AND PC3200 DIMM APPLICATIONSstandard by JEDEC Solid State Technology Association, 05/01/2004

JEDEC JESD33-B

JEDEC JESD33-B

STANDARD METHOD FOR MEASURING AND USING THE TEMPERATURE COEFFICIENT OF RESISTANCE TO DETERMINE THE TEMPERATURE OF A METALLIZATION LINEstandard by JEDEC Solid

JEDEC JESD82-9B

JEDEC JESD82-9B

DEFINITION OF SSTU32865 REGISTERED BUFFER WITH PARITY FOR 2R x 4 DDR2 RDIMM APPLICATIONSstandard by JEDEC Solid State Technology Association, 05/01/2007

JEDEC JESD87

JEDEC JESD87

STANDARD TEST STRUCTURE FOR RELIABILITY ASSESSMENT OF AlCu METALLIZATIONS WITH BARRIER MATERIALSstandard by JEDEC Solid State Technology Association, 07/01/2001

JEDEC JESD 12-1B

JEDEC JESD 12-1B

ADDENDUM No. 1 to JESD12 - TERMS AND DEFINITIONS FOR GATE ARRAYS AND CELL-BASED INTEGRATED CIRCUITSAmendment by JEDEC Solid State Technology Association,

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