JEDEC JESD22-A104D
TEMPERATURE CYCLINGstandard by JEDEC Solid State Technology Association, 03/01/2009
TEMPERATURE CYCLINGstandard by JEDEC Solid State Technology Association, 03/01/2009
GUIDELINES FOR GaAs MMIC AND FET LIFE TESTINGstandard by JEDEC Solid State Technology Association, 01/01/1993
RECOMMENDED STANDARD FOR THYRISTORSstandard by JEDEC Solid State Technology Association, 06/01/1972
PROCUREMENT STANDARD FOR KNOWN GOOD DIE (KGD)standard by JEDEC Solid State Technology Association, 09/01/2005
RECOMMENDED ESD-CDM TARGET LEVELSstandard by JEDEC Solid State Technology Association, 10/01/2009
TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITSstandard by JEDEC Solid State Technology Association, 11/01/1969
TEMPERATURE, BIAS, AND OPERATING LIFEstandard by JEDEC Solid State Technology Association, 11/01/2010
TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR DISCRETE SEMICONDUCTOR AND OPTOELECTRONIC DEVICESstandard by JEDEC Solid State Technology Association, 10/01/2009
0.6 V Low Voltage Swing Terminated Logic (LVSTL06)standard by JEDEC Solid State Technology Association, 12/01/2016
DEFINITION OF SKEW SPECIFICATIONS FOR STANDARD LOGIC DEVICESstandard by JEDEC Solid State Technology Association, 09/01/2003
EXPANDED SERIAL PERIPHERAL INTERFACE (xSPI) FOR NON VOLATILE MEMORY DEVICES, VERSION 1.0standard by JEDEC Solid State Technology Association, 08/01/2018