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ADDENDUM No. 5 to JESD24 - SINGLE PULSE UNCLAMPED INDUCTIVE SWITCHING (UIS) AVALANCHE TEST METHODAmendment by JEDEC Solid State Technology Association, 08/01/1990

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STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITSstandard by JEDEC Solid State Technology Association, 04/01/2011

Graphics Double Data Rate (GDDR6) SGRAM Standardstandard by JEDEC Solid State Technology Association, 07/01/2017

TEMPERATURE CYCLINGstandard by JEDEC Solid State Technology Association, 03/01/2009

GUIDELINES FOR GaAs MMIC AND FET LIFE TESTINGstandard by JEDEC Solid State Technology Association, 01/01/1993

HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)standard by JEDEC Solid State Technology Association, 11/01/2010

POD135 - 1.35 V PSEUDO OPEN DRAIN I/Ostandard by JEDEC Solid State Technology Association, 07/01/2010

MULTIMEDIACARD (MMC) MECHANICAL STANDARDstandard by JEDEC Solid State Technology Association, 12/01/2007

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TEST METHODS AND ACCEPTANCE PROCEDURES FOR THE EVALUATION OF POLYMERIC MATERIALSstandard by JEDEC Solid State Technology Association, 03/01/2018