JEDEC JESD 320-A (R2002)
CONDITIONS FOR MEASUREMENT OF DIODE STATIC PARAMETERSstandard by JEDEC Solid State Technology Association, 12/01/1992
CONDITIONS FOR MEASUREMENT OF DIODE STATIC PARAMETERSstandard by JEDEC Solid State Technology Association, 12/01/1992
Addendum No. 1 to JESD79-4, 3D Stacked DRAM StandardAmendment by JEDEC Solid State Technology Association, 02/01/2017
TEST METHOD FOR THE MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS USED IN INTEGRATED CIRCUITSstandard by JEDEC Solid State
NAND Flash Interface Interoperabilitystandard by JEDEC Solid State Technology Association, 07/01/2014
POD125 - 1.25 V PSEUDO OPEN DRAIN I/Ostandard by JEDEC Solid State Technology Association, 09/01/2017
SUGGESTED PRODUCT-DOCUMENTATION, CLASSIFICATIONS, AND DISCLAIMERSstandard by JEDEC Solid State Technology Association, 07/01/1996
Addendum 1 to JESD96A - INTEROPERABILITY AND COMPLIANCE TECHNICAL REQUIREMENTS FOR JEDEC STANDARD JESD96A - RECOMMENDED PRACTICE FOR USE WITH IEEE 802.11NAmendment
STANDARD DESCRIPTION OF 1.2 V CMOS LOGIC DEVICES (NORMAL RANGE OPERATION)standard by JEDEC Solid State Technology Association, 06/01/2001
QUALITY AND RELIABILITY STANDARDS AND PUBLICATIONSstandard by JEDEC Solid State Technology Association, 10/01/1999
TEST METHODS TO CHARACTERIZE VOIDING IN PRE-SMT BALL GRID ARRAY PACKAGESstandard by JEDEC Solid State Technology Association, 09/01/2010