PRODUCT DISCONTINUANCEstandard by JEDEC Solid State Technology Association, 12/01/2011

CHIP-PACKAGE INTERACTION UNDERSTANDING, IDENTIFICATION AND EVALUATIONstandard by JEDEC Solid State Technology Association, 03/01/2018

GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICESstandard by JEDEC Solid State Technology Association, 09/01/2012

WIDE I/O 2 (WideIO2)standard by JEDEC Solid State Technology Association, 08/01/2014

STANDARD LIST OF VALUES TO BE USED IN SEMICONDUCTOR DEVICE SPECIFICATIONS AND REGISTRATION FORMATstandard by JEDEC Solid State Technology Association, 10/01/1980

MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERSstandard by JEDEC Solid State Technology Association, 11/01/1972

FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTSstandard by JEDEC Solid State Technology Association, 12/01/2009

TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR MICROCOMPUTERS, MICROPROCESSORS, AND MEMORY INTEGRATED CIRCUITSstandard by JEDEC Solid State Technology Association, 12/01/2002

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCEstandard by JEDEC Solid State Technology Association, 02/01/1967

LOW TEMPERATURE STORAGE LIFEstandard by JEDEC Solid State Technology Association, 10/01/2015

A PROCEDURE FOR MEASURING N-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION UNDER DC STRESSstandard by JEDEC Solid State Technology Association, 12/01/2001

STANDARD FOR DESCRIPTION OF 3867 - 2.5 V, SINGLE 10-BIT, 2-PORT, DDR FET SWITCHstandard by JEDEC Solid State Technology Association, 11/01/2001