CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY SEMICONDUCTOR SUPPLIERSstandard by JEDEC Solid State Technology Association, 12/01/2011

NUMBERING OF LIKE-NAMED TERMINAL FUNCTIONS IN SEMICONDUCTOR DEVICES AND DESIGNATION OF UNITS IN MULTIPLE-UNIT SEMICONDUCTOR DEVICESstandard by JEDEC Solid State Technology Association,

MEASUREMENT OF SMALL SIGNAL HF, VHF, AND UHF POWER GAIN OF TRANSISTORSstandard by JEDEC Solid State Technology Association, 05/01/1965

TEST PROCEDURES FOR VERIFICATION OF MAXIMUM RATINGS OF POWER TRANSISTORSstandard by JEDEC Solid State Technology Association, 12/01/1967

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCEstandard by JEDEC Solid State Technology Association, 02/01/1967

LOW TEMPERATURE STORAGE LIFEstandard by JEDEC Solid State Technology Association, 10/01/2015

A PROCEDURE FOR MEASURING N-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION UNDER DC STRESSstandard by JEDEC Solid State Technology Association, 12/01/2001

STANDARD FOR DESCRIPTION OF 3867 - 2.5 V, SINGLE 10-BIT, 2-PORT, DDR FET SWITCHstandard by JEDEC Solid State Technology Association, 11/01/2001

MARKING AND LABELING OF COMPONENTS, PCBs AND PCBAs TO IDENTIFY LEAD (Pb), Pb-FREE AND OTHER ATTRIBUTESstandard by JEDEC Solid State Technology Association,

Handling, Packing, Shipping and Use of Moisture, Reflow, and Process Sensitive Devicesstandard by JEDEC Solid State Technology Association, 04/01/2018

STANDARD LIST OF VALUES TO BE USED IN SEMICONDUCTOR DEVICE SPECIFICATIONS AND REGISTRATION FORMATstandard by JEDEC Solid State Technology Association, 10/01/1980

MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERSstandard by JEDEC Solid State Technology Association, 11/01/1972