JEDEC JEP114.01

JEDEC JEP114.01

GUIDELINES FOR PARTICLE IMPACT NOISE DETECTION (PIND) TESTING, OPERATOR TRAINING, AND CERTIFICATIONstandard by JEDEC Solid State Technology Association, 10/01/2007

JEDEC JEP128

JEDEC JEP128

GUIDE FOR STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER LEVEL ELECTRICAL TESTINGstandard by JEDEC Solid State Technology Association, 11/01/1996

JEDEC JEP 148A

JEDEC JEP 148A

RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENTstandard by JEDEC Solid State Technology Association, 12/01/2008

JEDEC JEP160

JEDEC JEP160

Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devicesstandard by JEDEC Solid State Technology Association, 11/01/2011

JEDEC JEP70C

JEDEC JEP70C

Guide to Standards and Publications Relating to Quality and Reliability of Electronic Hardwarestandard by JEDEC Solid State Technology Association, 10/01/2013

JEDEC JEP151

JEDEC JEP151

, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devicesstandard by JEDEC Solid State Technology

JEDEC JEP78

JEDEC JEP78

RELATIVE SPECTRAL RESPONSE CURVES FOR SEMICONDUCTOR INFRARED DETECTORSstandard by JEDEC Solid State Technology Association, 10/01/1969

JEDEC JESD 46C

JEDEC JESD 46C

CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY SEMICONDUCTOR SUPPLIERSstandard by JEDEC Solid State Technology Association, 10/01/2006

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