Failure Mechanisms and Models for Semiconductor Devicesstandard by JEDEC Solid State Technology Association, 09/01/2016

METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITSstandard by JEDEC Solid State Technology Association, 01/01/1970

GUIDELINES FOR PARTICLE IMPACT NOISE DETECTION (PIND) TESTING, OPERATOR TRAINING, AND CERTIFICATIONstandard by JEDEC Solid State Technology Association, 10/01/2007

GUIDE FOR STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER LEVEL ELECTRICAL TESTINGstandard by JEDEC Solid State Technology Association, 11/01/1996

A PROCEDURE FOR EXECUTING SWEATstandard by JEDEC Solid State Technology Association, 08/01/2003

RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENTstandard by JEDEC Solid State Technology Association, 12/01/2008

Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devicesstandard by JEDEC Solid State Technology Association, 11/01/2011

SOLID STATE RELIABILITY ASSESSMENT QUALIFICATION METHODOLOGIESstandard by JEDEC Solid State Technology Association, 07/01/2012

Guide to Standards and Publications Relating to Quality and Reliability of Electronic Hardwarestandard by JEDEC Solid State Technology Association, 10/01/2013

, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devicesstandard by JEDEC Solid State Technology

RELATIVE SPECTRAL RESPONSE CURVES FOR SEMICONDUCTOR INFRARED DETECTORSstandard by JEDEC Solid State Technology Association, 10/01/1969

CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY SEMICONDUCTOR SUPPLIERSstandard by JEDEC Solid State Technology Association, 10/01/2006