JEDEC JEP114.01

JEDEC JEP114.01

GUIDELINES FOR PARTICLE IMPACT NOISE DETECTION (PIND) TESTING, OPERATOR TRAINING, AND CERTIFICATIONstandard by JEDEC Solid State Technology Association, 10/01/2007

JEDEC JEP128

JEDEC JEP128

GUIDE FOR STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER LEVEL ELECTRICAL TESTINGstandard by JEDEC Solid State Technology Association, 11/01/1996

JEDEC JEP 148A

JEDEC JEP 148A

RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENTstandard by JEDEC Solid State Technology Association, 12/01/2008

JEDEC JEP160

JEDEC JEP160

Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devicesstandard by JEDEC Solid State Technology Association, 11/01/2011

JEDEC JEP70C

JEDEC JEP70C

Guide to Standards and Publications Relating to Quality and Reliability of Electronic Hardwarestandard by JEDEC Solid State Technology Association, 10/01/2013

JEDEC JEP151

JEDEC JEP151

, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devicesstandard by JEDEC Solid State Technology

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