CIE x048-OP43

CIE x048-OP43

Click here to purchase

We have developed a new calibration capability for 200 nm to 400 nm ultraviolet light-emitting diodes (UV LEDs) using a Type D gonio-spectroradiometer. The recently-introduced mean differential continuous pulse (M-DCP) method is used to overcome the measurement difficulty associated with the initial forward voltage, VF, anomaly of a UV LED, which makes it impossible to use VF to infer junction temperature, TJ, during pulsed operation. The new measurement facility was validated indirectly by comparing the measured total luminous flux of a white LED with that measured using the NISTs 2.5 m absolute integrating sphere. The expanded calibration uncertainty for the total radiant flux is approximately 2 % to 3 % (k = 2) depending the wavelength of the UV LED.

Product Details

Published:
09/29/2021
Number of Pages:
6
File Size:
1 file , 1.2 MB
Note:
This product is unavailable in Belarus, Russia, Ukraine

You may also like

CIE ISO 23539:2023

CIE ISO 23539:2023

Photometry - The CIE system of physical photometrystandard by Commission Internationale de L'Eclairage, 2023

CIE 251:2023

CIE 251:2023

LED Reference Spectrum for Photometer Calibrationstandard by Commission Internationale de L'Eclairage, 01/01/2023

CIE x049-P13

CIE x049-P13

IMPACT OF SAMPLING RATE ON FLICKER METRIC CALCULATIONSConference Proceeding by Commission Internationale de L'Eclairage, 10/01/2022

CIE x049-P08

CIE x049-P08

FIELD MEASUREMENT OF TLM QUANTITIES IN LIGHTING SCENARIOSConference Proceeding by Commission Internationale de L'Eclairage, 10/01/2022

Back to Top